Development And Application Of A Grating Interferometer At The Cornell High Energy Synchrotron Source
| dc.contributor.author | Baur, Robin | en_US |
| dc.contributor.chair | Gruner, Sol Michael | en_US |
| dc.contributor.committeeMember | Sethna, James Patarasp | en_US |
| dc.contributor.committeeMember | Hoffstaetter, Georg Heinz | en_US |
| dc.contributor.committeeMember | Dale, Darren | en_US |
| dc.date.accessioned | 2013-09-05T15:21:19Z | |
| dc.date.available | 2013-09-05T15:21:19Z | |
| dc.date.issued | 2013-01-28 | en_US |
| dc.description.abstract | Conventional x-ray absorption imaging is a powerful and commonly-used technique in a wide variety of fields, but it has limited applicability for softer, lighter materials and for specimens whose internal structure has only small differences in density. In these situations, phase-contrast imaging steps into the breach. Phase contrast is based upon refraction rather than absorption, and can be as much as 1000 times more sensitive than conventional x-ray imaging in the right situations. This work describes the commissioning and application of a phase-sensitive x-ray grating interferometer that exploits the Talbot self-imaging effect of periodic objects illuminated by monochromatic light. Design considerations and tolerances are described in detail. Additionally, the development and characterization of a new detector for high-spatial-resolution, high-energy, high-speed imaging is presented. This detector uses a novel fiber-optic scintillator in place of conventional settledphosphor or film scintillators, and is shown to have significantly improved resolution over an existing lens-coupled detector used early in these experiments. Finally, the interferometer is used to characterize the properties of the illuminating x-ray source itself and to image fossil specimens of insects embedded in amber, which pose a particular challenge to absorption-contrast imaging. Possibilities for future upgrades and imaging projects are discussed. | en_US |
| dc.identifier.other | bibid: 8267591 | |
| dc.identifier.uri | https://hdl.handle.net/1813/33791 | |
| dc.language.iso | en_US | en_US |
| dc.subject | phase-contrast | en_US |
| dc.subject | imaging | en_US |
| dc.subject | x-ray | en_US |
| dc.title | Development And Application Of A Grating Interferometer At The Cornell High Energy Synchrotron Source | en_US |
| dc.type | dissertation or thesis | en_US |
| thesis.degree.discipline | Physics | |
| thesis.degree.grantor | Cornell University | en_US |
| thesis.degree.level | Doctor of Philosophy | |
| thesis.degree.name | Ph. D., Physics |
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