JavaScript is disabled for your browser. Some features of this site may not work without it.
A single-molecule approach to ZnO defect studies: Single photons and single defects
Author
Jungwirth, N. R.; Pai, Y. Y.; Chang, H. S.; MacQuarrie, E. R.; Nguyen, K. X.; Fuchs, G. D.
Abstract
Investigations that probe defects one at a time offer a unique opportunity to observe properties and dynamics that are washed out of ensemble measurements. Here we present confocal fluorescence measurements of individual defects in Al-doped ZnO nanoparticles and undoped ZnO sputtered films that are excited with sub-bandgap energy light. Photon correlation measurements yield both antibunching and bunching, indicative of single-photon emission from isolated defects that possess a metastable shelving state. The single-photon emission is in the range ~560 – 720 nm and typically exhibits two broad spectral peaks separated by ~150 meV. The excited state lifetimes range from 1 – 13 ns, consistent with the finite-size and surface effects of nanoparticles and small grains. We also observe discrete jumps in the fluorescence intensity between a bright state and a dark state. The dwell times in each state are exponentially distributed and the average dwell time in the bright (dark) state does (may) depend on the power of the exciting laser. Taken together, our measurements demonstrate the utility of a single-molecule approach to semiconductor defect studies and highlight ZnO as a potential host material for single-defect based applications.
Sponsorship
This work was supported by the Cornell Center for Materials Research with funding from the NSF MRSEC program (DMR-1120296), by the National Science Foundation (DMR-1254530), and by the Department of Energy Office of Science Graduate Fellowship Program (DOE SCGF), made possible in part by the American Recovery and Reinvestment Act of 2009, administered by ORISE-ORAU under contract no. DE-AC05-06OR23100.
Date Issued
2014-08-26Publisher
Figures published in: Journal of Applied Physics
Subject
single photon; single defect; single-molecule microscopy; quantum information; ZnO defects
Related Publication(s)
N. R. Jungwirth, Y. Y. Pai, H. S. Chang, E. R. MacQuarrie, K. X. Nguyen, and G. D. Fuchs, "A single-molecule approach to ZnO defect studies: single photons and single defects." J. Appl. Phys. 116, 043509 (2014).
Link(s) to Related Publication(s)
Previously Published As
Figures published in: N. R. Jungwirth, Y. Y. Pai, H. S. Chang, E. R. MacQuarrie, K. X. Nguyen, and G. D. Fuchs, "A single-molecule approach to ZnO defect studies: single photons and single defects." J. Appl. Phys. 116, 043509 (2014). http://dx.doi.org/10.1063/1.4890979
Type
dataset image
Related items
Showing items related by title, author, creator and subject.
-
USING SINGLE VIRION FUSION ASSAY TO STUDY INFLUENZA VIRUS ENTRY
Hsu, Hung-Lun (2018-05-30)Understanding the mechanism of influenza virus entry is critical for effectively developing anti-viral drugs and vaccines. The entry of influenza virus is mediated by two proteins: hemagglutinin (HA) and neuraminidase (NA). ... -
THE STRENGTH OF BRAZED SINGLE-LAP JOINTS
Kemmenoe, David Jonathan (2021-08)Brazing is a critical materials-joining technology because it can join like or dissimilar materials, create high performance joints for use at high operating temperatures, and create thousands of joints simultaneously due ... -
AN EXPLORATION OF DEFECT-BASED SINGLE PHOTON SOURCES: ZINC OXIDE AND HEXAGONAL BORON NITRIDE
Jungwirth, Nicholas Ryan (2018-12-30)Isolated point defects in wide bandgap semiconductors are single photon sources with applications in quantum optics, precision sensing, and quantum information processing technologies. Although the nitrogen-vacancy center ...