Admissible and Optimal Confidence Bands in Simple Linear Regression
Piegorsch, Walter W.; Cornell University. Biometrics Unit.; Cornell University. Dept. of Biometrics.; Cornell University. Dept. of Biological Statistics and Computational Biology.
Biometrics Unit Technical Reports; Number BU-835-M
This issue was undated. The date given is an estimate.14 pages, 1 article*Admissible and Optimal Confidence Bands in Simple Linear Regression* (Piegorsch, Walter W.) 14 pages
Statistics; Periodicals; Biomathematics; Biometry