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Using Cone Index Data to Explain Yield Variation Within a Field
Abstract
This is a Technical Paper from International Commission of Agricultural Engineering (CIGR, Commission Internationale du Genie Rural) E-Journal Volume 4 (2002): N. Isaac, R. Taylor, S. Staggenborg, M. Schrock, and D. Leikam. Using Cone Index Data to Explain Yield Variation Within a Field. Vol. IV. December 2002.
Description
Rosana G. Moreira, Editor-in-Chief; Texas A&M University
Date Issued
2002-12Publisher
International Commission of Agricultural Engineering
Subject
Cone Index Data; Agricultural Engineering
ISSN
1682-1130
Type
article