The Psychology of the Sick Building Syndrome
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Author
Hedge, Alan
Erickson, William A.
Rubin, Gail
Cornell University. Biometrics Unit.
Cornell University. Dept. of Biometrics.
Cornell University. Dept. of Biological Statistics and Computational Biology.
Journal / Series
Biometrics Unit Technical Reports; Number BU-1312-M
Description
42 pages, 1 article
*The Psychology of the Sick Building Syndrome* (Hedge, Alan; Erickson, William A.; Rubin, Gail) 42 pages
Date Issued
1995-12
Keywords
Type
periodical