Statistical Characteristics of Repeated Block Designs

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Author

Raghavarao, D.

Federer, W. T.

Seiden, E.

Lee, F.-C. H.

Cornell University. Biometrics Unit.

Cornell University. Dept. of Biometrics.

Cornell University. Dept. of Biological Statistics and Computational Biology.

Journal / Series

Biometrics Unit Technical Reports; Number BU-685-M

Description

9 pages, 1 article

*Statistical Characteristics of Repeated Block Designs* (Raghavarao, D.; Federer, W. T.; Seiden, E.; Lee, F.-C. H.) 9 pages

Date Issued

1979-07

Keywords

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Type

periodical