The physics of microscopy is governed by scattering processes. In the context of electron microscopy, aberrations in the incident beam and information transfer through electron scattering fundamentally constrain the spatial resolution. This dissertation explores advances in both the correction of aberrations and novel imaging methods enabled by using different scattering channels. In Part I (Chapter 1 and 2), I approach aberration correction as a phase-space optimization problem from the perspective of accelerator physics, minimizing beam emittance growth of the electrons through the microscope column. Weyl-Wigner transform provides the quasi-probability distribution of probe states and directly connects the aberration function to beam emittance in phase space. A deep learning model predicts emittance growth from Ronchigrams and is used within a Bayesian optimization framework to automate aberration corrector tuning, achieving higher speed and precision. In Part II (Chapter 3 and 4), I examine and identify the contrast transfer mechanisms and information limits from all electron scattering events in four-dimensional scanning transmission electron microscopy (4D-STEM). Following H. Rose’s formalism, the scattering components can contribute to coherent phase, coherent amplitude, and incoherent amplitude contrast. Using a unified phase-space framework, I analyze how probe geometry, detector configuration, and these scattering dynamics enable new imaging methods, shape the contrast transfer functions, and ultimately bound the limit of recoverable information. Together, these contributions establish a theoretical foundation for information retrieval in 4D-STEM and provide new tools and insights for dose-efficient, high-resolution imaging and data interpretation in modern electron microscopy.

显微学的物理图像由散射过程所描述。电子显微学中，空间分辨率在根本上由入射电子束的像差及其与样品散射过程中的信息传递所限定。本论文同时探索像差的矫正与利用不同散射通道可实现的新成像方法。 第一部分（第一章和第二章）从加速器物理的视角出发，通过最小化电子束在电镜中的束流发射度增长，将像差矫正视作相空间中的优化问题。Weyl–Wigner 变换提供了电子探针态在相空间中的准概率分布，直接将像差函数与电子束的发射度联系起来。深度学习模型能够直接从 Ronchigram 中预测电子束发射度的增长，并在贝叶斯优化框架下实现像差校正的自动化，实现更高的矫正速度与精度。 第二部分（第三章和第四章）探究 4D-STEM 中存在的所有电子散射过程及其所产生的衬度传递机制与信息极限。遵循 H. Rose 的成像理论框架，电子散射过程可分别贡献相干相位衬度、相干振幅衬度以及非相干振幅衬度。在统一的相空间框架下，文中分析了不同的探针几何形状、探测器构型及以上各散射动力学过程如何共同引出新的成像方法、塑造衬度传递函数，并最终限定可重构信息的极限。 综上所述，这些研究成果为 4D-STEM 中的信息提取贡献了理论基础，并为现代电子显微学中的高剂量效率、高分辨率成像与数据分析提供了新的工具和启发。