A Chi-Square Statistic for Goodness-of-Fit Tests within the Exponential Family

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Author

Rao, K. C.

Robson, D. S.

Cornell University. Biometrics Unit.

Cornell University. Dept. of Biometrics.

Cornell University. Dept. of Biological Statistics and Computational Biology.

Journal / Series

Biometrics Unit Technical Reports; Number BU-503-M

Description

17 pages, 1 article

*A Chi-Square Statistic for Goodness-of-Fit Tests within the Exponential Family* (Rao, K. C.; Robson, D. S.) 17 pages

Date Issued

1974-03

Keywords

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Type

periodical