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  4. Reliability Study Of Flash Memory And Its Applications

Reliability Study Of Flash Memory And Its Applications

File(s)
sw626thesisPDF.pdf (2.32 MB)
Permanent Link(s)
https://hdl.handle.net/1813/29496
Collections
Cornell Theses and Dissertations
Author
Wu, Shuo
Date Issued
2011-08-31
Keywords
Reliability
•
Flash Memory
•
Random Number Generator
Committee Chair
Kan, Edwin Chihchuan
Committee Member
Suh, Gookwon Edward
Degree Discipline
Electrical Engineering
Degree Name
M.S., Electrical Engineering
Degree Level
Master of Science
Type
dissertation or thesis

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