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  4. DISLOCATION IMAGING WITH BRAGG COHERENT X-RAY DIFFRACTION IMAGING UNDER POISSON NOISE

DISLOCATION IMAGING WITH BRAGG COHERENT X-RAY DIFFRACTION IMAGING UNDER POISSON NOISE

File(s)
Song_cornell_0058O_12201.pdf (4.52 MB)
Permanent Link(s)
http://doi.org/10.7298/qnzt-5720
https://hdl.handle.net/1813/117105
Collections
Cornell Theses and Dissertations
Author
Song, Yumeng
Abstract

Bragg Coherent Diffraction Imaging has been applied to nanomaterial characterization for imaging atomic movement and phase transformation. Its ability to produce unique three-dimensional defect and displacement field images has been extremely helpful for understanding material property under different environment, such as energy cells or optical materials in various working conditions. In this study, we use computer simulations to reveal the influence of Poisson noise on the resultant reconstruction images of atomic defects within a nanoparticle. The study focuses mainly on dislocation imaging, including dislocation loops. By simulating the reconstructions under different Poisson noise level, we defined the threshold of the Poisson Noise level for different number of dislocations in the atomic structure. We have also discovered the effects of the size and shape of the dislocation loops.

Description
28 pages
Date Issued
2024-12
Committee Chair
Singer, Andrej
Committee Member
Suntivich, Jin
Degree Discipline
Materials Science and Engineering
Degree Name
M.S., Materials Science and Engineering
Degree Level
Master of Science
Type
dissertation or thesis
Link(s) to Catalog Record
https://newcatalog.library.cornell.edu/catalog/16921919

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