Characterization Of Single Defects In Zinc Oxide
| dc.contributor.author | Pai, Yun-Yi | en_US |
| dc.contributor.chair | Fuchs, Gregory David | en_US |
| dc.contributor.committeeMember | Muller, David Anthony | en_US |
| dc.date.accessioned | 2014-07-28T19:25:07Z | |
| dc.date.available | 2019-05-26T06:01:05Z | |
| dc.date.issued | 2014-05-25 | en_US |
| dc.description.abstract | This thesis summarizes my work on characterizing isolated defects in zinc oxide (ZnO). In chapter 1, I will briefly review the major strength of quantum information processing over classical computation. I will then review the basic properties of nitrogen-vacancy centers, the most-studied point defect species in diamond, and how they motivate the search for defects of similar properties in other semiconductor materials for defect-based quantum information processing. In chapter 2, I will describe our initial study on the optical properties of successfully isolated defects in ZnO: their fluorescence spectra, excited state lifetimes, and their photodynamics including blinking. In chapter 3, I will detail my work on extending the capability of an atomic force microscope to include simultaneous imaging in a confocal geometry. In chapter 4, I will discuss possible directions for our defect studies. | en_US |
| dc.identifier.other | bibid: 8641256 | |
| dc.identifier.uri | https://hdl.handle.net/1813/37147 | |
| dc.language.iso | en_US | en_US |
| dc.subject | ZnO Defects | en_US |
| dc.subject | Quantum Information Processing | en_US |
| dc.subject | AFM | en_US |
| dc.title | Characterization Of Single Defects In Zinc Oxide | en_US |
| dc.type | dissertation or thesis | en_US |
| thesis.degree.discipline | Applied Physics | |
| thesis.degree.grantor | Cornell University | en_US |
| thesis.degree.level | Master of Science | |
| thesis.degree.name | M.S., Applied Physics |
Files
Original bundle
1 - 1 of 1