Library

eCommons

 

Using Cone Index Data to Explain Yield Variation Within a Field

Simple item page
dc.contributor.authorIsaac, N.en_US
dc.contributor.authorTaylor, R.en_US
dc.contributor.authorStaggenborg, S.en_US
dc.contributor.authorSchrock, M.en_US
dc.contributor.authorLeikam, D.en_US
dc.date.accessioned2008-03-28T18:41:19Z
dc.date.available2008-03-28T18:41:19Z
dc.date.issued2002-12en_US
dc.descriptionRosana G. Moreira, Editor-in-Chief; Texas A&M Universityen_US
dc.description.abstractThis is a Technical Paper from International Commission of Agricultural Engineering (CIGR, Commission Internationale du Genie Rural) E-Journal Volume 4 (2002): N. Isaac, R. Taylor, S. Staggenborg, M. Schrock, and D. Leikam. Using Cone Index Data to Explain Yield Variation Within a Field. Vol. IV. December 2002.en_US
dc.identifier.issn1682-1130en_US
dc.identifier.urihttps://hdl.handle.net/1813/10298
dc.language.isoen_USen_US
dc.publisherInternational Commission of Agricultural Engineeringen_US
dc.subjectCone Index Dataen_US
dc.subjectAgricultural Engineeringen_US
dc.titleUsing Cone Index Data to Explain Yield Variation Within a Fielden_US
dc.typearticleen_US

Files

Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
PM 02 004a Isaac.pdf
Size:
179.33 KB
Format:
Adobe Portable Document Format
Download

Collections

CIGR E-Journal Volume 4