Engineering: Cornell Quarterly, Vol.07, No.3 (Autumn 1972): Seeing with Electrons and Ions

dc.contributor.authorSilcox, John
dc.contributor.authorSass, Stephen
dc.contributor.authorSiegel, Benjamin
dc.contributor.authorSeidman, David
dc.contributor.authorBerth, Donald
dc.description.abstractIN THIS ISSUE: The Chemical Nature of Atoms: A New Subject for Electron Microscopy /2 (John Silcox, director of the School of Applied and Engineering Physics at Cornell, describes the development of instrumentation and techniques that can provide a new kind of information on the structure of materials.) ... Electron Microscopy in the Study of Materials /9 (The director of Cornell's electron microscope facility at the College of Engineering, Stephen L. Sass, shows how the microscopic examination of specimens is used in studying the physical properties of materials.) ... High-Resolution Microscopy of Biomacromolecules: Present Limitations and Future Possibilities /14 (Cornell research that is extending the high-resolution capabilities of electron microscopy is discussed by Benjamin M. Siegel, professor of applied physics, in an article on the application of this technique to studies of biological interest, in particular the delineation of the ultrastructure of macromolecules.) ... Seeing With Ions: High-Resolution Magnification Without Lenses /21 (A high-resolution microscope in which ions rather than electrons create the image is discussed by David N. Seidman, associate professor of materials science and engineering. The field ion microscope, an instrument without lenses, permits the observation of individual atoms on the surface of a metal.) ... Register /30 (The appointment of Edmund T. Cranch to succeed Andrew Schultz, Jr., as College of Engineering dean is featured, and other staff and faculty appointments are covered.) ... Faculty Publications /41en_US
dc.format.extent43132918 bytes
dc.publisherInternet-First University Pressen_US
dc.subjectCornell Universityen_US
dc.subjectElectron Microscopyen_US
dc.subjectApplied Physicsen_US
dc.subjectfield ion microscopeen_US
dc.titleEngineering: Cornell Quarterly, Vol.07, No.3 (Autumn 1972): Seeing with Electrons and Ionsen_US


Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
41.13 MB
Adobe Portable Document Format