Scanned Probe Microscopy Studies Of Thin Organic Films Using Cantilever Frequency Noise
Loading...
No Access Until
Permanent Link(s)
Collections
Other Titles
Authors
Abstract
Scanned probe microscopy techniques can be used to create nanometerresolution surface maps of forces as small as an attonewton. In this work, a new method for measuring local electric field gradients at the surface of a polymer film is presented. The centerpiece of this thesis is a protocol for measuring and deciphering noise in a cantilever's resonance frequency (Chapter 4). The protocol was tested on thin polymer film samples; these measurements confirmed the predictions of a zero-free parameter theory described in Chapter 3, which relates cantilever frequency noise to local dielectric fluctuations emanating from within the polymer. Chapter 5 is a presentation of preliminary efforts towards achieving a local measurement of carrier mobility in an organic semiconductor.
Journal / Series
Volume & Issue
Description
June 2015 - This Biographical Sketched was edited/removed at the request of the author.
Sponsorship
Date Issued
2009-10-13T20:08:58Z
Publisher
Keywords
Location
Effective Date
Expiration Date
Sector
Employer
Union
Union Local
NAICS
Number of Workers
Committee Chair
Committee Co-Chair
Committee Member
Degree Discipline
Degree Name
Degree Level
Related Version
Related DOI
Related To
Related Part
Based on Related Item
Has Other Format(s)
Part of Related Item
Related To
Related Publication(s)
Link(s) to Related Publication(s)
References
Link(s) to Reference(s)
Previously Published As
Government Document
ISBN
ISMN
ISSN
Other Identifiers
Rights
Rights URI
Types
dissertation or thesis