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Sequential equivalence testing and repeated confidence intervals, with applications to normal and binary response

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dc.contributor.authorTurnbull, B.en_US
dc.contributor.authorJennison, C.en_US
dc.date.accessioned2007-11-09T20:03:00Z
dc.date.available2007-11-09T20:03:00Z
dc.date.issued1990-09en_US
dc.description.abstractThis paper published in "Stochastic Processes and Their Applications" 42 (1993), 91-110en_US
dc.format.extent2620328 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.citation928en_US
dc.identifier.urihttps://hdl.handle.net/1813/8811
dc.language.isoen_USen_US
dc.publisherCornell University Operations Research and Industrial Engineeringen_US
dc.subjectOperations Researchen_US
dc.subjectIndustrial Engineeringen_US
dc.subjecttechnical reporten_US
dc.titleSequential equivalence testing and repeated confidence intervals, with applications to normal and binary responseen_US
dc.typetechnical reporten_US

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