Show simple item record

dc.contributor.authorOhmoli, Yohichien_US
dc.date.accessioned2007-04-23T18:20:02Z
dc.date.available2007-04-23T18:20:02Z
dc.date.issued1977-07en_US
dc.identifier.citationhttp://techreports.library.cornell.edu:8081/Dienst/UI/1.0/Display/cul.cs/TR77-317en_US
dc.identifier.urihttps://hdl.handle.net/1813/7438
dc.description.abstractNO ABSTRACT SUPPLIEDen_US
dc.format.extent895403 bytes
dc.format.extent333403 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/postscript
dc.language.isoen_USen_US
dc.publisherCornell Universityen_US
dc.subjectcomputer scienceen_US
dc.subjecttechnical reporten_US
dc.titleA Study of Automatic Indexing for Patent Examinationen_US
dc.typetechnical reporten_US


Files in this item

Thumbnail
Thumbnail

This item appears in the following Collection(s)

Show simple item record

Statistics