Optimal Confidence Bands in Simple Linear Regression
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Piegorsch, Walter W.; Cornell University. Biometrics Unit.; Cornell University. Dept. of Biometrics.; Cornell University. Dept. of Biological Statistics and Computational Biology.
Biometrics Unit Technical Reports; Number BU-811-M
This issue was undated. The date given is an estimate.20 pages, 1 article*Optimal Confidence Bands in Simple Linear Regression* (Piegorsch, Walter W.) 20 pages
Statistics; Periodicals; Biomathematics; Biometry