A Note on Confidence Bands in Bilinear Segmented Regression

Piegorsch, Walter W.; Cornell University. Biometrics Unit.; Cornell University. Dept. of Biometrics.; Cornell University. Dept. of Biological Statistics and Computational Biology.

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Author

Piegorsch, Walter W.; Cornell University. Biometrics Unit.; Cornell University. Dept. of Biometrics.; Cornell University. Dept. of Biological Statistics and Computational Biology.

Journal/Series

Biometrics Unit Technical Reports; Number BU-751-M

Description

6 pages, 1 article

*A Note on Confidence Bands in Bilinear Segmented Regression* (Piegorsch, Walter W.) 6 pages

Date Issued

1981-08

Subject

Statistics; Periodicals; Biomathematics; Biometry

Type

periodical

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