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dc.contributor.authorWu, Shuoen_US
dc.date.accessioned2012-06-28T20:57:37Z
dc.date.available2016-12-30T06:46:57Z
dc.date.issued2011-08-31en_US
dc.identifier.otherbibid: 7745419
dc.identifier.urihttps://hdl.handle.net/1813/29496
dc.language.isoen_USen_US
dc.subjectReliabilityen_US
dc.subjectFlash Memoryen_US
dc.subjectRandom Number Generatoren_US
dc.titleReliability Study Of Flash Memory And Its Applicationsen_US
dc.typedissertation or thesisen_US
thesis.degree.disciplineElectrical Engineering
thesis.degree.grantorCornell Universityen_US
thesis.degree.levelMaster of Science
thesis.degree.nameM.S., Electrical Engineering
dc.contributor.chairKan, Edwin Chihchuanen_US
dc.contributor.committeeMemberSuh, Gookwon Edwarden_US


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