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dc.contributor.authorYazdanian, Showkaten_US
dc.date.accessioned2009-10-13T20:08:58Z
dc.date.available2009-10-13T20:08:58Z
dc.date.issued2009-10-13T20:08:58Z
dc.identifier.otherbibid: 6711585
dc.identifier.urihttps://hdl.handle.net/1813/13896
dc.descriptionJune 2015 - This Biographical Sketched was edited/removed at the request of the author.
dc.description.abstractScanned probe microscopy techniques can be used to create nanometerresolution surface maps of forces as small as an attonewton. In this work, a new method for measuring local electric field gradients at the surface of a polymer film is presented. The centerpiece of this thesis is a protocol for measuring and deciphering noise in a cantilever's resonance frequency (Chapter 4). The protocol was tested on thin polymer film samples; these measurements confirmed the predictions of a zero-free parameter theory described in Chapter 3, which relates cantilever frequency noise to local dielectric fluctuations emanating from within the polymer. Chapter 5 is a presentation of preliminary efforts towards achieving a local measurement of carrier mobility in an organic semiconductor.en_US
dc.language.isoen_USen_US
dc.titleScanned Probe Microscopy Studies Of Thin Organic Films Using Cantilever Frequency Noiseen_US
dc.typedissertation or thesisen_US


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