JavaScript is disabled for your browser. Some features of this site may not work without it.
Scanned Probe Microscopy Studies Of Thin Organic Films Using Cantilever Frequency Noise

Author
Yazdanian, Showkat
Abstract
Scanned probe microscopy techniques can be used to create nanometerresolution surface maps of forces as small as an attonewton. In this work, a new method for measuring local electric field gradients at the surface of a polymer film is presented. The centerpiece of this thesis is a protocol for measuring and deciphering noise in a cantilever's resonance frequency (Chapter 4). The protocol was tested on thin polymer film samples; these measurements confirmed the predictions of a zero-free parameter theory described in Chapter 3, which relates cantilever frequency noise to local dielectric fluctuations emanating from within the polymer. Chapter 5 is a presentation of preliminary efforts towards achieving a local measurement of carrier mobility in an organic semiconductor.
Description
June 2015 - This Biographical Sketched was edited/removed at the request of the author.
Date Issued
2009-10-13Type
dissertation or thesis