Using Cone Index Data to Explain Yield Variation Within a Field

Isaac, N.; Taylor, R.; Staggenborg, S.; Schrock, M.; Leikam, D.

Using Cone Index Data to Explain Yield Variation Within a Field

File(s)

PM 02 004a Isaac.pdf (179.33 KB)

Permanent Link(s)

https://hdl.handle.net/1813/10298

Collections

CIGR E-Journal Volume 4

Author

Isaac, N.

Taylor, R.

Staggenborg, S.

Schrock, M.

Leikam, D.

Abstract

This is a Technical Paper from International Commission of Agricultural Engineering (CIGR, Commission Internationale du Genie Rural) E-Journal Volume 4 (2002): N. Isaac, R. Taylor, S. Staggenborg, M. Schrock, and D. Leikam. Using Cone Index Data to Explain Yield Variation Within a Field. Vol. IV. December 2002.

Description

Rosana G. Moreira, Editor-in-Chief; Texas A&M University

Date Issued

2002-12

Publisher

International Commission of Agricultural Engineering

Keywords

Cone Index Data

•

Agricultural Engineering

ISSN

1682-1130

Type

article