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  4. USING THE COUPLED MICRO-REACTOR/UHV SURFACE ANALYSIS SYSTEM AND THE QCM-BASED VISCOUS FLOW REACTOR TO STUDY AREA-SELECTIVE DEPOSITION

USING THE COUPLED MICRO-REACTOR/UHV SURFACE ANALYSIS SYSTEM AND THE QCM-BASED VISCOUS FLOW REACTOR TO STUDY AREA-SELECTIVE DEPOSITION

File(s)
Wang_cornell_0058O_11287.pdf (3.66 MB)
Permanent Link(s)
https://doi.org/10.7298/bf5e-my57
https://hdl.handle.net/1813/110475
Collections
Cornell Theses and Dissertations
Author
Wang, Yen-Hsiung
Abstract

Patterning during a nanofabrication process could be designed with a variety of techniques to manifest spatial control of chemical reactions and it is categorized as a top-down or a bottom-up process in general. While the state-of-the-art top-down techniques meet challenges, a bottom-up deposition process shows advantages in some aspects. In our research, we focus our work on modified process of atomic layer deposition (ALD) and chemical vapor deposition (CVD) to achieve area-selective deposition (ASD). We have been trying to find a pathway to achieve ASD with the formation of a reversible blocking layer exclusively on the non-growth surface. During the deposition process, a third gas-phase molecule, what we refer to as “co-adsorbate”, is introduced to compete for adsorption sites on the non-growth surface while leave precursor adsorption unimpeded on the growth surface. It is a very promising approach mainly due to the self-aligning and high-throughput essence.

Description
109 pages
Date Issued
2021-08
Keywords
ALD
•
ASD
•
CVD
•
QCM
•
XPS
Committee Chair
Engstrom, James R.
Committee Member
DiStasio, Jr, Robert A.
Degree Discipline
Chemical Engineering
Degree Name
M.S., Chemical Engineering
Degree Level
Master of Science
Type
dissertation or thesis
Link(s) to Catalog Record
https://newcatalog.library.cornell.edu/catalog/15160160

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